design for testability
- 网络可测性设计;可测试性设计;可测试设计;设计
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Research on Design for Testability and Test Algorithm of Embedded Memory
嵌入式存储器的可测性设计及测试算法研究
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Research on the Full - Scan Method in Design for Testability
全扫描结构可测性设计方法的研究
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A Study on Design for Testability of the Application in the Simulation
可测试性设计在仿真中应用研究
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A Study of the System Level Design for Testability
系统级可测试性设计的研究
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An Approach to Design for Testability in System Level Based on Structural Model
基于结构模型的系统级测试性设计(DFT)技术研究
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The Research of Design for Testability and System Partition on Electronic Equipment
电子设备测试性设计及系统划分的研究
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Research on Design for Testability Based on the Framework of SOC
基于SOC架构的可测性设计方法学研究
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Design for Testability : to test the design .
可测性设计:有利于测试的设计。
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Theory on Design for Testability Based on the Sufficient Measure
基于充分度的可测性设计理论研究
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Design for Testability was proposed to solve the problem .
于是,人们引入了可测试性设计方法来解决这个问题。
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Design for testability has become one of the important parts in IC design .
可测性设计DFT技术已成为IC设计中的一个重要技术。
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Design for testability of digital integrated circuits based on boundary scan technology
基于边界扫描技术的集成电路可测性设计
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The progresses in test and design for testability are put forward .
然后讨论了系统芯片设计中的测试和可测试性设计,最后对测试和可测试性设计的未来发展方向进行了展望。
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Design for Testability and Automatic Test Generation Techniques for Digital IC ′ s
数字IC可测性设计和自动测试生成技术
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Design for Testability of Very Large Scale Integrated-Circuit and Application Strategy
大规模集成电路可测性设计及其应用策略
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Design for Testability and Implement Technology in ASIC Design
ASIC集成电路的可测性设计与技术实现
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Design For Testability ( DFT ) techniques have been proposed .
可测试性设计(DFT)技术被提了出来。
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Scan Cell and Its Application in the Design for Testability of ASIC
扫描单元及其在ASIC可测性设计中的应用
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Contract-based design for testability of components provides effective means to component testing .
基于合约的构件易测试性设计为构件测试提供了一种有效的手段。
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Boundary Scan Design for Testability and Its Description Language VHDL
边界扫描可测性设计及其VHDL描述
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Design for Testability in Honeycomb-like Rapid Embedded System Platform
类蜂巢结构快速样机平台的可测试性设计
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Design for Testability in Ground to Air Missile
Air(初三适用)地空导弹系统可测试性设计
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Design for testability about digital tuning system DTS 0614
数字调谐系统芯片DTS0614的可测性设计
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The approach presented can be used to control parallel test flow and design for testability of SOC .
该方法可用于SOC并行测试流程控制及SOC的可测性设计。
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Design for Testability and DFT Design Flow in EDA
数字IC可测性设计及其EDA流程
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Full-scan test is one of the most effective and popular design for testability technologies .
全扫描测试是最有效和流行的可测性设计技术之一。
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DFT ( design for testability ) has become a necessary link of materiel development .
测试性设计已经成为装备研制中一个必不可少的环节。
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Design for Testability of a Novel High-Speed DCT in VLSI
高速离散余弦变换VLSI实现的可测性设计
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Reducing the power consumption in design for testability is a new research field in the academic and industrial circles .
降低测试期间的功耗是当前学术界和工业界新出现的一个研究领域。
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Design for Testability of Memory in GPS Baseband Chip
GPS基带芯片中存储器的可测性设计