design for testability

美 [dɪˈzaɪn fɔːr tɛstəˈbɪlɪti]英 [dɪˈzaɪn fɔː(r) tɛstəˈbɪlɪti]
  • 网络可测性设计;可测试性设计;可测试设计;设计
design for testabilitydesign for testability
  1. Research on Design for Testability and Test Algorithm of Embedded Memory

    嵌入式存储器的可测性设计及测试算法研究

  2. Research on the Full - Scan Method in Design for Testability

    全扫描结构可测性设计方法的研究

  3. A Study on Design for Testability of the Application in the Simulation

    可测试性设计在仿真中应用研究

  4. A Study of the System Level Design for Testability

    系统级可测试性设计的研究

  5. An Approach to Design for Testability in System Level Based on Structural Model

    基于结构模型的系统级测试性设计(DFT)技术研究

  6. The Research of Design for Testability and System Partition on Electronic Equipment

    电子设备测试性设计及系统划分的研究

  7. Research on Design for Testability Based on the Framework of SOC

    基于SOC架构的可测性设计方法学研究

  8. Design for Testability : to test the design .

    可测性设计:有利于测试的设计。

  9. Theory on Design for Testability Based on the Sufficient Measure

    基于充分度的可测性设计理论研究

  10. Design for Testability was proposed to solve the problem .

    于是,人们引入了可测试性设计方法来解决这个问题。

  11. Design for testability has become one of the important parts in IC design .

    可测性设计DFT技术已成为IC设计中的一个重要技术。

  12. Design for testability of digital integrated circuits based on boundary scan technology

    基于边界扫描技术的集成电路可测性设计

  13. The progresses in test and design for testability are put forward .

    然后讨论了系统芯片设计中的测试和可测试性设计,最后对测试和可测试性设计的未来发展方向进行了展望。

  14. Design for Testability and Automatic Test Generation Techniques for Digital IC ′ s

    数字IC可测性设计和自动测试生成技术

  15. Design for Testability of Very Large Scale Integrated-Circuit and Application Strategy

    大规模集成电路可测性设计及其应用策略

  16. Design for Testability and Implement Technology in ASIC Design

    ASIC集成电路的可测性设计与技术实现

  17. Design For Testability ( DFT ) techniques have been proposed .

    可测试性设计(DFT)技术被提了出来。

  18. Scan Cell and Its Application in the Design for Testability of ASIC

    扫描单元及其在ASIC可测性设计中的应用

  19. Contract-based design for testability of components provides effective means to component testing .

    基于合约的构件易测试性设计为构件测试提供了一种有效的手段。

  20. Boundary Scan Design for Testability and Its Description Language VHDL

    边界扫描可测性设计及其VHDL描述

  21. Design for Testability in Honeycomb-like Rapid Embedded System Platform

    类蜂巢结构快速样机平台的可测试性设计

  22. Design for Testability in Ground to Air Missile

    Air(初三适用)地空导弹系统可测试性设计

  23. Design for testability about digital tuning system DTS 0614

    数字调谐系统芯片DTS0614的可测性设计

  24. The approach presented can be used to control parallel test flow and design for testability of SOC .

    该方法可用于SOC并行测试流程控制及SOC的可测性设计。

  25. Design for Testability and DFT Design Flow in EDA

    数字IC可测性设计及其EDA流程

  26. Full-scan test is one of the most effective and popular design for testability technologies .

    全扫描测试是最有效和流行的可测性设计技术之一。

  27. DFT ( design for testability ) has become a necessary link of materiel development .

    测试性设计已经成为装备研制中一个必不可少的环节。

  28. Design for Testability of a Novel High-Speed DCT in VLSI

    高速离散余弦变换VLSI实现的可测性设计

  29. Reducing the power consumption in design for testability is a new research field in the academic and industrial circles .

    降低测试期间的功耗是当前学术界和工业界新出现的一个研究领域。

  30. Design for Testability of Memory in GPS Baseband Chip

    GPS基带芯片中存储器的可测性设计